发明名称 METHOD OF FORMING OPENINGS IN A SEMICONDUCTOR DEVICE AND A SEMICONDUCTOR DEVICE FABRICATED BY THE METHOD
摘要 A method of forming openings to a layer of a semiconductor device comprises forming a dielectric layer over the layer of the semiconductor device, and forming a mask over the dielectric layer. The mask comprises a plurality of mask openings arranged in a regular pattern extending over the dielectric layer and the plurality of mask openings include a plurality of first mask openings and a plurality of second mask openings, each of the plurality of first mask openings being greater in size than each of the plurality of second mask openings. The method further comprises reducing the size of the plurality of second mask openings such that each of the second mask openings is substantially closed and removing portions of the dielectric layer through the plurality of first mask openings to provide openings extending through the dielectric layer to the layer.
申请公布号 US2010291770(A1) 申请公布日期 2010.11.18
申请号 US20080812035 申请日期 2008.01.23
申请人 WARRICK SCOTT;AMINPUR MASSUD ABUBAKER;CONLEY WILL;RIVIERE-CAZEAUX LIONEL 发明人 WARRICK SCOTT;AMINPUR MASSUD ABUBAKER;CONLEY WILL;RIVIERE-CAZEAUX LIONEL
分类号 H01L21/306 主分类号 H01L21/306
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