<p>An inspection apparatus configured to measure a property of a substrate (W) includes an illumination source (51), a beam splitter (53), a first polarizer (52) positioned between the illumination source and the beam splitter, an objective lens (15) and an optical device (54) that alters a polarization state of radiation traveling through it positioned between the beam splitter and the substrate and a second polarizer (55) positioned between the beam splitter and a detector (56). An axis of the second polarizer is rotated with respect to an axis of the first polarizer. Radiation polarized by the first polarizer that reflects off any optical elements (57) between the beam splitter and the optical device is prevented from entering the detector by the second polarizer. Only radiation that passes twice through the optical device (54) has its polarization direction rotated so that it passes through the second polarizer and enters the detector.</p>
申请公布号
WO2010130673(A1)
申请公布日期
2010.11.18
申请号
WO2010EP56332
申请日期
2010.05.10
申请人
ASML NETHERLANDS B.V.;DE WIT, JOHANNES;SINKE, ARNOLD;TAS, MARNIX;HUGERS, RONALD
发明人
DE WIT, JOHANNES;SINKE, ARNOLD;TAS, MARNIX;HUGERS, RONALD