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经营范围
发明名称
SEMICONDUCTOR MEMORY AND TEST SYSTEM
摘要
申请公布号
EP2003652(B1)
申请公布日期
2010.11.17
申请号
EP20060730214
申请日期
2006.03.28
申请人
FUJITSU SEMICONDUCTOR LIMITED
发明人
KOBAYASHI, HIROYUKI
分类号
G11C29/44;G11C29/12;G11C29/50
主分类号
G11C29/44
代理机构
代理人
主权项
地址
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