发明名称 |
PACKAGE ON PACKAGE PREVENTING CIRCUIT PATTERN LIFT DEFECT AND METHOD FOR FABRICATING THE SAME |
摘要 |
PURPOSE: A package on package preventing circuit pattern lift defect and a method for fabricating the same are provided to prevent the cleavage defect of a circuit pattern caused by the stress of temperature variation by implementing a role of a buffer layer which absorbs the stress by the temperature variation. CONSTITUTION: A package manufacturing substrate(110) is prepared. A plurality of semiconductor chips(116) is laminated on the substrate. A pad redistribution pattern(118) is formed on the laminated top part of semiconductor chip. A copper post(120) is formed on a connection terminal of the pad redistribution pattern. |
申请公布号 |
KR20100121231(A) |
申请公布日期 |
2010.11.17 |
申请号 |
KR20090040290 |
申请日期 |
2009.05.08 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
KIM, KYUNG MAN;KANG, IN KU |
分类号 |
H01L23/12;H01L23/48 |
主分类号 |
H01L23/12 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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