发明名称 PACKAGE ON PACKAGE PREVENTING CIRCUIT PATTERN LIFT DEFECT AND METHOD FOR FABRICATING THE SAME
摘要 PURPOSE: A package on package preventing circuit pattern lift defect and a method for fabricating the same are provided to prevent the cleavage defect of a circuit pattern caused by the stress of temperature variation by implementing a role of a buffer layer which absorbs the stress by the temperature variation. CONSTITUTION: A package manufacturing substrate(110) is prepared. A plurality of semiconductor chips(116) is laminated on the substrate. A pad redistribution pattern(118) is formed on the laminated top part of semiconductor chip. A copper post(120) is formed on a connection terminal of the pad redistribution pattern.
申请公布号 KR20100121231(A) 申请公布日期 2010.11.17
申请号 KR20090040290 申请日期 2009.05.08
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KIM, KYUNG MAN;KANG, IN KU
分类号 H01L23/12;H01L23/48 主分类号 H01L23/12
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