发明名称 Method and apparatus for accounting for changes in transistor characteristics
摘要 A device for accounting for changes in characteristics of a transistor is presented. The device includes a transistor and a comparator receiving a feedback signal from the transistor and a reference signal. The comparator provides an output to a bias voltage generator. The bias voltage generator includes an input connected to the output of the comparator and an output connected to the transistor. In some embodiments of the invention the transistor is a double gate transistor and the bias voltage generator is applied to a top gate of the double gate transistor in order to control characteristics of the transistor such as turn on voltage.
申请公布号 US7834676(B2) 申请公布日期 2010.11.16
申请号 US20090357261 申请日期 2009.01.21
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 LEE WOO-GEUN;SONG JEAN-HO;KWON YEONG-KEUN;LEE MIN-CHEOL;KIM KI-WON;LEE YOUNG-WOOK
分类号 G11C11/34 主分类号 G11C11/34
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