发明名称 Integrated circuit system employing grain size enlargement
摘要 An integrated circuit system that includes: providing a substrate including an active device with a gate top surface exposed; implanting a do pant within the gate to alter the grain size of the gate material; forming a dielectric layer over the active device and the substrate; and annealing the integrated circuit system to transfer the stress of the dielectric layer into the active device.
申请公布号 US7833888(B2) 申请公布日期 2010.11.16
申请号 US20080116156 申请日期 2008.05.06
申请人 CHARTERED SEMICONDUCTOR MANUFACTURING LTD. 发明人 TAN CHUNG FOONG;LEE JAE GON;TEO LEE WEE;QUEK ELGIN KIOK BOONE
分类号 H01L21/425 主分类号 H01L21/425
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