发明名称 Polymers, Positive Resist Compositions and Patterning Process
摘要 A polymer is composed of recurring units of hydroxyvinylnaphthalene, (meth)acrylic units having a lactone ring fused to a bridged ring, and (meth)acrylic units having acid labile groups. A positive resist composition comprising the polymer as a base resin, when exposed to high-energy radiation and developed, exhibits a high sensitivity, a high resolution, and a minimal line edge roughness due to controlled swell during development.
申请公布号 KR100994873(B1) 申请公布日期 2010.11.16
申请号 KR20070021405 申请日期 2007.03.05
申请人 发明人
分类号 C08F293/00;C08F212/00;C08F220/00;G03F7/039 主分类号 C08F293/00
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