发明名称 Chip scale package and method for manufacturing the same
摘要 A chip scale package includes a patterned circuit layer attached to the active surface of a semiconductor chip through an anisotropic conductive adhesive layer such that contact pads on a lower surface of the patterned circuit layer are electrically coupled to corresponding bonding pads on the semiconductor chip. The patterned circuit layer has a plurality of openings formed therein at locations corresponding to the contact pads such that each of the contact pads has a portion exposed from an upper surface of the patterned circuit layer through the corresponding opening. A plurality of metal bumps are respectively disposed in the openings and mounted to the exposed portions of the contact pads for making external electrical connection. The present invention further provides a method for manufacturing the chip scale package at the wafer-level.
申请公布号 US7833837(B2) 申请公布日期 2010.11.16
申请号 US20070757795 申请日期 2007.06.04
申请人 ADVANCED SEMICONDUCTOR ENGINEERING, INC. 发明人 YANG JUN YOUNG;JOO YOU OCK;JUNG DONG PIL
分类号 H01L21/00 主分类号 H01L21/00
代理机构 代理人
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