发明名称 Semiconductor manufacturing apparatus equipped with wafer inspection device and inspection techniques
摘要 A semiconductor manufacturing apparatus includes a processing unit for processing at least one wafer; a loading/unloading unit for loading/unloading at least wafer; an input/output chamber for taking in a processed wafer from the processing unit and taking out the processed wafer to the loading/unloading unit, and taking in a unprocessed wafer from the loading/unloading unit and taking out the unprocessed wafer to the reaction unit; and a wafer inspection device for inspecting the processed wafer through a light transmittable top portion of the input/output chamber, through which light is transmittable, while the processed wafer is temporarily placed in the input/output chamber.
申请公布号 US7832353(B2) 申请公布日期 2010.11.16
申请号 US20080198004 申请日期 2008.08.25
申请人 ASM JAPAN K.K. 发明人 TAKIZAWA MASAHIRO;NISHINO TERUHIDE
分类号 B05C11/00 主分类号 B05C11/00
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