发明名称 Service and diagnostic logic scan apparatus and method
摘要 A diagnostic and service logic program for a programmable logic controller (PLC) is provided in parallel with the main machine logic program. The diagnostic and service logic program has the same functionality as the main machine logic program, but can be modified and operated independently of the main machine logic program for testing and debugging a faulty main machine logic program. The PLC can be switched between programs for testing and debugging.
申请公布号 US7836347(B2) 申请公布日期 2010.11.16
申请号 US20070873852 申请日期 2007.10.17
申请人 GE INTELLIGENT PLATFORMS INC. 发明人 MILLER DANIEL H.;MERCER FERRELL;POPELAS JUDY
分类号 G06F11/00 主分类号 G06F11/00
代理机构 代理人
主权项
地址