发明名称 End point detection for direct ion milling to induce magnetic anisotropy in a magnetic layer
摘要 A method for manufacturing a magnetic layer with a magnetic anisotropy. The method includes an endpoint detection process for determining an end point to carefully control the final thickness of the magnetic layer. The method includes depositing a magnetic layer and then depositing a sacrificial layer over the magnetic layer. A low power angled ion milling is then performed until the magnetic layer has been reached. The angled ion milling can be performed at an angle relative to normal and without rotation in order to form an anisotropic surface texture that induces a magnetic anisotropy in the magnetic layer. An indicator layer may be included between the magnetic layer and the sacrificial layer in order to further improve endpoint detection.
申请公布号 US7833388(B2) 申请公布日期 2010.11.16
申请号 US20060615865 申请日期 2006.12.22
申请人 HITACHI GLOBAL STORAGE TECHNOLOGIES NETHERLANDS B.V. 发明人 CAREY MATTHEW JOSEPH;CHILDRESS JEFFREY ROBINSON;MAAT STEFAN
分类号 C23C14/34 主分类号 C23C14/34
代理机构 代理人
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