发明名称 Multi-layer thick metallization structure for a microelectronic device, intergrated circuit containing same, and method of manufacturing an integrated circuit containing same
摘要 A multi-layer thick metallization structure for a microelectronic device includes a first barrier layer (111), a first metal layer (112) over the first barrier layer, a first passivation layer (113) over the first metal layer, a via structure (114) extending through the first passivation layer, a second barrier layer (115) over the first passivation layer and in the via structure, a second metal layer (116) over the second barrier layer, and a second passivation layer (117) over the second metal layer and the first passivation layer.
申请公布号 US7833899(B2) 申请公布日期 2010.11.16
申请号 US20080214747 申请日期 2008.06.20
申请人 INTEL CORPORATION 发明人 LEE KEVIN J.
分类号 H01L21/4763 主分类号 H01L21/4763
代理机构 代理人
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