发明名称 Programmable-resistance memory cell
摘要 The present invention relates to a memory cell comprising: a resistive structure; at least two electrodes coupled to the resistive structure, and at least one hydrogen reservoir structure, wherein the application of an electrical signal to one of the at least two electrodes causes the electrical resistance of the resistive structure to be modified by altering a hydrogen-ion concentration in the resistive structure.
申请公布号 US7834339(B2) 申请公布日期 2010.11.16
申请号 US20060612501 申请日期 2006.12.19
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 BEDNORZ JOHANNES G.;JOSEPH ERIC A.;KARG SIEGFRIED F.;LAM CHUNG H.;MEIJER GERHARD I.;SCHROTT ALEJANDRO G.
分类号 H01L45/00 主分类号 H01L45/00
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