| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide a preferable abnormal detection by enabling an abnormal pattern to be specified. <P>SOLUTION: A sensor controller 20 is connected to a sensor element 10, and an applied voltage control circuit 21 for applying a voltage to the sensor element 10 is disposed in the sensor controller 20. Element current IL is detected by a shunt resistor 33, and its detection result is outputted to a CPU 50 as an A/F detection voltage AFO via an A/F signal output section 41. The CPU 50 changes a voltage applied state with respect to the sensor element 10 from a first state into a second state. The CPU 50 detects an abnormality about the sensor element 10 on the basis of terminal voltages VS+, VS- and A/F detection voltages AFO before and after the changing operation from the first state to the second state. <P>COPYRIGHT: (C)2011,JPO&INPIT |
