发明名称 |
SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME |
摘要 |
<p><P>PROBLEM TO BE SOLVED: To provide a semiconductor device for surely forming a contact hole reaching a gate wiring and a method of manufacturing the same. <P>SOLUTION: The method of manufacturing the semiconductor device includes the steps of: forming a first stress film 38; forming an insulating film 40 having an etching property different from that of the first stress film; etching the insulating film in a second region by using a first mask 60 covering a first region 2 and side-etching the insulating film of a part in the first region, adjacent to the second region; etching the first stress film using the first mask; forming a second stress film having an etching property different from that of the insulating film; etching the second stress film so that a part of the second stress film overlaps with a part of the first stress film and a part of the insulating film by using a second mask covering the second region of which end face at the first region side lies on the insulating film; and forming the contact hole reaching the gate wiring 20 at an interface between the first and second regions. <P>COPYRIGHT: (C)2011,JPO&INPIT</p> |
申请公布号 |
JP2010258221(A) |
申请公布日期 |
2010.11.11 |
申请号 |
JP20090106581 |
申请日期 |
2009.04.24 |
申请人 |
FUJITSU SEMICONDUCTOR LTD |
发明人 |
KIRIMURA TOMOYUKI;OGURA HISANORI |
分类号 |
H01L21/8238;H01L21/318;H01L21/3205;H01L21/768;H01L23/52;H01L23/522;H01L27/092;H01L29/423;H01L29/49 |
主分类号 |
H01L21/8238 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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