摘要 |
A system for testing a circuit. The system comprises a first circuit mounted on an embedded first circuit board and a test circuit mounted on the embedded first circuit board. The system further comprises a second circuit board on the first circuit board, the second circuit board including a second circuit and a test device external to the first and second circuit board. The test circuit is effective to send at least one first test signal from the test circuit to the first circuit, receive a first response of the at least one first test signal from the first circuit, and forward the first response to the test device.
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