发明名称 System and method for testing a circuit
摘要 A system for testing a circuit. The system comprises a first circuit mounted on an embedded first circuit board and a test circuit mounted on the embedded first circuit board. The system further comprises a second circuit board on the first circuit board, the second circuit board including a second circuit and a test device external to the first and second circuit board. The test circuit is effective to send at least one first test signal from the test circuit to the first circuit, receive a first response of the at least one first test signal from the first circuit, and forward the first response to the test device.
申请公布号 US2010287428(A1) 申请公布日期 2010.11.11
申请号 US20090387626 申请日期 2009.05.05
申请人 BAE SYSTEMS INFORMATION AND ELECTRONIC SYSTEMS INTEGRATION INC. 发明人 WERNICKI MICHAEL W.
分类号 G01R31/3185;G06F11/267 主分类号 G01R31/3185
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