发明名称 TANTALUM ALUMINUM OXYNITRIDE HIGH-K DIELECTRIC
摘要 Electronic apparatus and methods of forming the electronic apparatus may include a tantalum aluminum oxynitride film for use in a variety of electronic systems and devices. The tantalum aluminum oxynitride film may be structured as one or more monolayers. The tantalum aluminum oxynitride film may be formed using atomic layer deposition. Metal electrodes may be disposed on a dielectric containing a tantalum aluminum oxynitride film.
申请公布号 US2010283537(A1) 申请公布日期 2010.11.11
申请号 US20100838983 申请日期 2010.07.19
申请人 发明人 FORBES LEONARD;AHN KIE Y.;BHATTACHARYYA ARUP
分类号 H03H11/24;H01L21/02;H01L21/302;H01L29/92 主分类号 H03H11/24
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