发明名称 CHARGED PARTICLE BEAM DRAWING METHOD AND DEVICE
摘要 <P>PROBLEM TO BE SOLVED: To provide a charged particle beam drawing method and a device which reflect beam current density and exposure amount tolerance on an edge of a cross section of a variable beam on determination of an exposure amount, and to improve line width linearity of a resist pattern formed on a material to be drawn. <P>SOLUTION: A beam current is measured by a current detection part 17 while changing a beam cross section dimension by a forming deflector 12. Beam current density distribution is obtained from the beam current and beam cross section. Based on the beam current density distribution, the beam current density on the edge of the beam cross section of each beam cross section dimension is determined. <P>COPYRIGHT: (C)2011,JPO&INPIT
申请公布号 JP2010258053(A) 申请公布日期 2010.11.11
申请号 JP20090103550 申请日期 2009.04.22
申请人 JEOL LTD 发明人 GOTO KAZUYA
分类号 H01L21/027;G03F7/20;H01J37/04;H01J37/305 主分类号 H01L21/027
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