发明名称 |
METHOD FOR SOI BODY CONTACT FET WITH REDUCED PARASITIC CAPACITANCE |
摘要 |
PROBLEM TO BE SOLVED: To mount a body contact on a semiconductor-on-insulator device, thereby reducing parasitic capacitance in the device. SOLUTION: A substrate includes a semiconductor layer arranged so as to be covered on an insulating layer. The semiconductor layer includes the substrate including a semiconductor body and an separation region existing around the outer periphery of the semiconductor body, and a gate structure covered on the semiconductor layer of the substrate. A method for manufacturing a semiconductor device is provided. The semiconductor device includes the gate structure existing on a first part of an upper face of the semiconductor body and a silicide body contact directly physically brought into contact with a second part of the semiconductor body separated from the first part of the semiconductor body by a non-silicide semiconductor region. COPYRIGHT: (C)2011,JPO&INPIT |
申请公布号 |
JP2010258471(A) |
申请公布日期 |
2010.11.11 |
申请号 |
JP20100155374 |
申请日期 |
2010.07.08 |
申请人 |
INTERNATL BUSINESS MACH CORP <IBM> |
发明人 |
CHANG LELAND;CHOU ANTHONY I;NARASIMHA SHREESH;SLEIGHT JEFFREY W |
分类号 |
H01L29/786;H01L21/768;H01L23/522 |
主分类号 |
H01L29/786 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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