发明名称 SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF
摘要 PROBLEM TO BE SOLVED: To provide a thin film transistor, and a manufacturing method thereof, for reducing contact resistance between an oxide semiconductor layer and a source electrode layer or drain electrode layer, for stable electric characteristics. SOLUTION: A thin film transistor using an oxide semiconductor layer is formed by forming a buffer layer whose conductivity is higher than that of the oxide semiconductor layer, and electrically connecting the oxide semiconductor layer to a source electrode layer or drain electrode layer 105a, 105b through the buffer layer. The buffer layer is subjected to an inverse sputtering treatment and thermal treatment under nitrogen atmosphere, to form a buffer layer whose conductivity is higher than that of the oxide semiconductor layer. COPYRIGHT: (C)2011,JPO&INPIT
申请公布号 JP2010258431(A) 申请公布日期 2010.11.11
申请号 JP20100078211 申请日期 2010.03.30
申请人 SEMICONDUCTOR ENERGY LAB CO LTD 发明人 ASANO YUJI;HIZUKA JUNICHI
分类号 H01L29/786;G02F1/1368;H01L21/28;H01L21/336;H01L21/768;H01L29/417;H01L51/50;H05B33/14 主分类号 H01L29/786
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