发明名称 SPUTTERING METHOD
摘要 PROBLEM TO BE SOLVED: To provide a reactive sputtering method capable of performing athin film formation while keeping a high sputter rate without being affected by an insulating film formed on the peripheral area of a target. SOLUTION: The sputtering method has a process of applying an electric power to conductive targets 41 arranged opposite to a substrate S to be treated in a sputtering chamber 11 while introducing a reactive gas into the sputtering chamber, forming a plasma atmosphere in the sputtering chamber and, thereby, sputtering the respective targets to form a predetermined thin film on the surface of the substrate to be treated, wherein an accumulation input power is monitored by a sputter power source E which performs power-inputting to the targets and, when the accumulation value attains a predetermined value, the introduction of the reactive gas is stopped, only the sputter gas is introduced and the targets are sputtered for a predetermined time. COPYRIGHT: (C)2011,JPO&INPIT
申请公布号 JP2010255052(A) 申请公布日期 2010.11.11
申请号 JP20090106979 申请日期 2009.04.24
申请人 ULVAC JAPAN LTD 发明人 OISHI YUICHI;KIYOTA JUNYA;ARAI MAKOTO;ISHIBASHI SATORU;KOBAYASHI HIROSHI
分类号 C23C14/34 主分类号 C23C14/34
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