发明名称 Semiconductor device and manufacturing method thereof
摘要 A semiconductor device having SRAM cell units each comprising a pair of a first driving transistor and a second driving transistor, a pair of a first load transistor and a second load transistor, and a pair of a first access transistor and a second access transistor, wherein each of the transistors comprises a semiconductor layer projecting upward from a substrate plane, a gate electrode extending on opposite sides of the semiconductor layer so as to stride over a top of the semiconductor layer, a gate insulating film interposed between the gate electrode and the semiconductor layer, and a pair of source/drain areas formed in the semiconductor layer; and the first and second driving transistors each have a channel width larger than that of at least either each of the load transistors or each of the access transistors.
申请公布号 US7830703(B2) 申请公布日期 2010.11.09
申请号 US20050570037 申请日期 2005.05.25
申请人 NEC CORPORATION 发明人 TAKEDA KOICHI;NOMURA MASAHIRO;TAKEUCHI KIYOSHI;WAKABAYASHI HITOSHI;YAMAGAMI SHIGEHARU;KOH RISHO;TERASHIMA KOICHI;TANAKA KATSUHIKO;TANAKA MASAYASU
分类号 G11C11/00;H01L21/8244;H01L27/11 主分类号 G11C11/00
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