发明名称 Semiconductor apparatus and method of manufacturing semiconductor apparatus
摘要 A semiconductor apparatus with a superjunction structure includes a gate electrode which fills a trench that is formed in an epitaxial layer, and a column region which is surrounded by the gate electrode in a plane view. A photomask for forming the column region is elaborated. The photomask has a compensation pattern that compensates a deformation of a photo resist pattern caused by photo interference and a deformation of the ion implantation region diffused by heat treatment. Therefore extending direction of the gate electrode and the outer edge of the column region are substantially parallel.
申请公布号 US7829417(B2) 申请公布日期 2010.11.09
申请号 US20080128865 申请日期 2008.05.29
申请人 NEC ELECTRONICS CORPORATION 发明人 NINOMIYA HITOSHI;MIURA YOSHINAO;KAWASHIMA YOSHIYA
分类号 H01L21/336 主分类号 H01L21/336
代理机构 代理人
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