| 摘要 |
PURPOSE: A socket for testing semiconductor is provided to performs the test about a plurality of socket and a structure is stable at the same time. CONSTITUTION: A slot hole(810) penetrated toward the top and bottom is formed in the connection part(800). A conductive sheet is combined in the joint hole of the base cover. An electrical conducting material is formed in insulator into the thickness direction. The electrical conducting material is an insulator having conductive unit and elasticity and includes an insulation part which is an area except the conductive part. |
