发明名称 |
METHOD OF MANUFACTURING SOI WAFER |
摘要 |
<p><P>PROBLEM TO BE SOLVED: To provide a method of manufacturing an SOI wafer with a partial SOI structure at low cost in an easy manner. <P>SOLUTION: The method of manufacturing the SOI wafer with the partial SOI structure includes steps of: forming a first insulating film on a surface of a silicon single-crystal wafer; forming a non-single-crystal film on a surface of the first insulating film; forming an opening that reaches the surface of the surface of the silicon single-crystal wafer from a surface of the non-single-crystal silicon film to obtain a silicon single-crystal wafer having the first insulating film and non-single-crystal silicon film laminated partially on the surface; and forming the partial SOI structure including the first insulating film as a buried insulating film by causing the non-single-crystal silicon film to migrate so as to come into contact with a part of the opening where the silicon single-crystal wafer is exposed by carrying out RTA processing on the silicon single-crystal wafer in an atmosphere of hydrogen gas, inert gas or a mixed gas of the hydrogen gas and the inert gas, and changing the non-single-crystal silicon film into a single-crystal film. <P>COPYRIGHT: (C)2011,JPO&INPIT</p> |
申请公布号 |
JP2010251444(A) |
申请公布日期 |
2010.11.04 |
申请号 |
JP20090097752 |
申请日期 |
2009.04.14 |
申请人 |
SHIN ETSU HANDOTAI CO LTD |
发明人 |
KOBAYASHI NORIHIRO;ISHIZUKA TORU |
分类号 |
H01L21/02;H01L21/20;H01L27/12 |
主分类号 |
H01L21/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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