发明名称 EYE EXAMINATION APPARATUS
摘要 <P>PROBLEM TO BE SOLVED: To provide an eye examination apparatus capable of reliably preventing the front part of a measurement instrument body from coming into contact with the face of a subject when moving the measurement instrument body, and also rapidly performing measurement. <P>SOLUTION: The eye examination apparatus includes: a measurement instrument body position detecting means 25 for detecting the present position of the measurement instrument body 12 with respect to the original point position (0, 0); a contour line position coordinate data storage part 26 for storing contour line position coordinate data Q1, Q2, Q1', Q2' with respect to the original point position; a feature point position coordinate data storage part 26 for storing the portion of the face of the subject, on which the front part of the measurement instrument body 12 is predicted to be abutted, as feature point position coordinate data N', C2', C1' by defining the portion as the feature point and defining the original point as reference; a determining means 25 for determining, based on the contour line position coordinate data and the feature point position coordinate data, whether the front part of the measurement instrument body abuts onto the face of the subject when keeping driving as it is, based on a driving command; and a control means 25 for controlling the measurement instrument body, so as to avoid the face of the subject, based on the determination result of the determining means 25, regardless of the driving command. <P>COPYRIGHT: (C)2011,JPO&INPIT
申请公布号 JP2010246740(A) 申请公布日期 2010.11.04
申请号 JP20090099643 申请日期 2009.04.16
申请人 TOPCON CORP 发明人 SATO TOSHIAKI;TAMURA TAICHI;INUZUKA NAOKI
分类号 A61B3/10 主分类号 A61B3/10
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