发明名称 DEVICE MANUFACTURING METHOD, AND LITHOGRAPHIC APPARATUS
摘要 <P>PROBLEM TO BE SOLVED: To prevent an image error such as an intensity imbalance between adjacent bright lines in a projected pattern, which may occur due to mask pattern surface topography although a mask is used to print the pattern. <P>SOLUTION: A projection system PS may include an optical phase adjuster 310 so as to help alleviate or eliminate the problem of intensity imbalance. The optical phase adjuster 310 is constructed and arranged to adjust a phase of an electric field of optical radiation beam DB traversing the adjuster 310. A reduction of intensity imbalance is achieved by suitably adjusting the phases of diffraction radiations DB of the 0th order, plus first-order and minus first-order radiated from the mask pattern. By adjusting the phase differently for different portions of the illumination, the method can be applied such that no decrease of depth of focus due to, for example, the 0th order occurs. <P>COPYRIGHT: (C)2011,JPO&INPIT
申请公布号 JP2010251761(A) 申请公布日期 2010.11.04
申请号 JP20100093709 申请日期 2010.04.15
申请人 ASML NETHERLANDS BV 发明人 DE WINTER LAURENTIUS CORNELIUS;FINDERS JOZEF MARIA
分类号 H01L21/027;G03F7/20 主分类号 H01L21/027
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