发明名称 SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF
摘要 <p><P>PROBLEM TO BE SOLVED: To provide a crystalline silicon thin-film semiconductor device reducing off-leak current, having good current rise characteristics. <P>SOLUTION: This thin-film transistor having an amorphous silicon layer and a crystalline silicon layer as semiconductor layers is characterized in that the current rise characteristics are improved because a drain electrode is made to directly touch the crystalline silicon layer of the semiconductor layer. <P>COPYRIGHT: (C)2011,JPO&INPIT</p>
申请公布号 JP2010251549(A) 申请公布日期 2010.11.04
申请号 JP20090099942 申请日期 2009.04.16
申请人 CANON INC 发明人 TAMURA MASAHIRO
分类号 H01L29/786 主分类号 H01L29/786
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