发明名称 Method of making multi-layer structure for metal-insulator-metal capacitor
摘要 The present invention discloses a method of making a multi-layer structure for metal-insulator-metal capacitors, in which, a bottom electrode plate layer is formed on a substrate, wherein a Ti/TiN layer serving as a top anti-reflection coating (top ARC) of the bottom electrode plate layer including a titanium layer and a titanium nitride layer formed on the titanium layer is formed using a first and a second physical vapor deposition (PVD) processes at a temperature ranging from 25 to 400° C., and then a first capacitor dielectric layer, a middle electrode plate layer, a second capacitor dielectric layer, and a top electrode plate layer are formed on the bottom electrode plate layer in an order from bottom to top.
申请公布号 US2010279484(A1) 申请公布日期 2010.11.04
申请号 US20090432772 申请日期 2009.04.30
申请人 WANG CHUN-KAI;HUANG CHUN-CHIH;WU CHUN-MING 发明人 WANG CHUN-KAI;HUANG CHUN-CHIH;WU CHUN-MING
分类号 H01L21/02 主分类号 H01L21/02
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