发明名称 OPENING/SHORT CIRCUIT INSPECTION METHOD OF EXTERNAL TERMINAL IN INTEGRATED CIRCUIT, AND OPENING/SHORT CIRCUIT INSPECTION DEVICE OF EXTERNAL TERMINAL IN INTEGRATED CIRCUIT
摘要 PROBLEM TO BE SOLVED: To provide an opening/short circuit inspection method and an opening/short circuit inspection device which detect a short circuit, without depending on visual observation or a probe. SOLUTION: An integrated circuit 10 includes a power source terminal P11 to which the power source is supplied from the outside, a circuit 101 which operates based on the power source, and the external terminals P10 consisting of N individual ( N is 3 or more natural numbers ) in which a first potential H and a second potential L which is different from the first potential H output arbitrarily by control from outside, which are connected into a first circuit 101, juxtaposed together with predetermined direction. In the external terminals P10, the first potential is made output into external terminals from one side of direction into M individual ( M is 1 to N natural numbers ), the second potential which is different from the first potential is made output into external terminals from (M+1) individual to N individual, when the current value flowing through a power source terminal 11 becomes over a predetermined value, it is determined that the external terminal between M individual and (M+1) individual is short circuited. COPYRIGHT: (C)2011,JPO&INPIT
申请公布号 JP2010249802(A) 申请公布日期 2010.11.04
申请号 JP20100034961 申请日期 2010.02.19
申请人 DAIKIN IND LTD 发明人 OKANO TAKASHI
分类号 G01R31/04;G01R31/28 主分类号 G01R31/04
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