| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide an AD converter which can achieve AD conversion of high bit accuracy while shortening the read time, and to provide a solid state image sensor and a camera system. <P>SOLUTION: Each column processing circuit 151 has: first and second comparators 152-1 and 152-2 which compare one analog signal obtained from a pixel via a vertical signal line 116 with first and second reference voltages Vslop1 and Vslop2; a first latch 153-1 which includes a counter for counting the comparison time of the first comparator 152-1 and holds the count result of the counter; a second latch 153-2 which includes a counter for counting the comparison time of the second comparator 152-2 and holds the count result of the counter; and a logic circuit 154 which detects the predetermined states after AD conversion separately from each other based on a digital value held in the first latch 153-1 and a digital value held in the second latch 153-2 and determines a digital definite value. <P>COPYRIGHT: (C)2011,JPO&INPIT |
