发明名称 LITHOGRAPHIC APPARATUS AND METHOD
摘要 A method of projecting a patterned beam onto a substrate using an EUV lithographic apparatus having a projection system (PS) including a plurality of mirrors (12-16). The method includes the following steps. Using the projection system (PS) to project the patterned beam onto the substrate (W) while moving a final mirror (16) of the projection system (PS) in a direction substantially perpendicular to the surface of the substrate (W). Rotating the final mirror (16) to substantially compensate for unwanted translation of the projected patterned radiation beam on the substrate due to the movement of the mirror.
申请公布号 WO2010124903(A1) 申请公布日期 2010.11.04
申请号 WO2010EP53506 申请日期 2010.03.18
申请人 ASML NETHERLANDS B.V.;STREEFKERK, BOB;DE JONGH, ROBERTUS 发明人 STREEFKERK, BOB;DE JONGH, ROBERTUS
分类号 G03F7/20 主分类号 G03F7/20
代理机构 代理人
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