发明名称 |
METHOD FOR MANUFACTURING SEMICONDUCTOR SUBSTRATE |
摘要 |
PROBLEM TO BE SOLVED: To provide a novel manufacturing method of a semiconductor substrate containing silicon carbide. SOLUTION: The method for manufacturing the semiconductor device includes the steps of performing carbonization treatment on a surface of a silicon substrate to form a silicon carbide layer; adding ions to the silicon substrate to form an embrittlement region in the silicon substrate; bonding the silicon substrate and a base substrate with insulating layers interposed therebetween; heating the silicon substrate and separating the silicon substrate at the embrittlement region to form a stacked layer of the silicon carbide layer and a silicon layer over the base substrate with the insulating layers interposed therebetween; and removing the silicon layer to expose a surface of the silicon carbide layer. COPYRIGHT: (C)2011,JPO&INPIT
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申请公布号 |
JP2010251724(A) |
申请公布日期 |
2010.11.04 |
申请号 |
JP20100065782 |
申请日期 |
2010.03.23 |
申请人 |
SEMICONDUCTOR ENERGY LAB CO LTD |
发明人 |
TAKAYAMA TORU |
分类号 |
H01L21/02;H01L21/20;H01L21/265;H01L21/28;H01L21/336;H01L21/76;H01L21/8234;H01L21/8238;H01L27/08;H01L27/088;H01L27/092;H01L27/12;H01L29/12;H01L29/78;H01L29/786 |
主分类号 |
H01L21/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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