发明名称 BGA PACKAGE SUBSTRATE AND TEST IT USING BGA PACKAGE TESTING METHODS
摘要 PURPOSE: A substrate for a BGA(Ball Grid Array) package test and a BGA package testing method using the same are provided to smoothly test a degradation rate of a BGA package. CONSTITUTION: A substrate(100) is installed between a connection socket(20) and a BGA package(30) to test the BGA package. The substrate is used for testing the defective rate of the BGA package through a surface contact between a connection terminal(22) of the connection socket and a ball type connection terminal(32) of the BGA package.
申请公布号 KR20100117376(A) 申请公布日期 2010.11.03
申请号 KR20090036096 申请日期 2009.04.24
申请人 SOLID MECA CO., LTD. 发明人 KIM, TAE WAN
分类号 G01R1/067;G01R31/26;H01L21/66 主分类号 G01R1/067
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