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发明名称
METHOD OF HELPING PARTICLE DETECTION, METHOD OF PARTICLE DETECTION, APPARATUS FOR HELPING PARTICLE DETECTION, AND SYSTEM FOR PARTICLE DETECTION
摘要
申请公布号
KR20100117622(A)
申请公布日期
2010.11.03
申请号
KR20107018825
申请日期
2009.01.20
申请人
TOKYO ELECTRON LIMITED
发明人
KAWAMURA SHIGERU;HAYASHI TERUYUKI
分类号
G01N15/14;G01N21/47;G01N21/71;G01N21/88
主分类号
G01N15/14
代理机构
代理人
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地址
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