发明名称 Fabrication method of semiconductor device
摘要 A technique is provided which can exactly recognize a chip to be picked up when picking up the chip from a wafer sheet in a process of die bonding a thin chip. A camera is coupled to one end of a lens barrel, an objective lens is attached to an opposite end of the lens barrel, and an image of a main surface of a chip is photographed through the objective lens. A surface-emitting lighting unit, a diffusing plate and a half mirror are internally provided between the lens barrel and the chip. Further, another lens barrel having a coaxial drop lighting function of radiating light to the main surface of the chip along the same optical axis as that of the camera is disposed.
申请公布号 US7824932(B2) 申请公布日期 2010.11.02
申请号 US20090436647 申请日期 2009.05.06
申请人 RENESAS ELECTRONICS CORPORATION 发明人 KOBASHI HIDEHARU;MAKI HIROSHI;MOCHIZUKI MASAYUKI;MAKITA YOSHIAKI
分类号 H01L21/66 主分类号 H01L21/66
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