发明名称 Semiconductor memory device including a repair circuit which includes mode fuses
摘要 In a semiconductor memory device, a repair circuit includes mode fuses to select one of plural repair modes corresponding to plural kinds of defects, respectively. The semiconductor memory device can repair a defective memory cell having operational margin defect without using redundancy memory cells.
申请公布号 US7826295(B2) 申请公布日期 2010.11.02
申请号 US20080076063 申请日期 2008.03.13
申请人 ELPIDA MEMORY, INC. 发明人 MASUMIZU ATSUSHI;OKUMA SADAYUKI
分类号 G11C17/18 主分类号 G11C17/18
代理机构 代理人
主权项
地址