发明名称 Short bridge phase change memory cells
摘要 Random access memory cells having a short phase change bridge structure and methods of making the bridge structure via shadow deposition. The short bridge structure reduces the heating efficiency needed to switch the logic state of the memory cell. In one particular embodiment, the memory cell has a first electrode and a second electrode with a gap therebetween. The first electrode has an end at least partially non-orthogonal to the substrate and the second electrode has an end at least partially non-orthogonal to the substrate. A phase change material bridge extends over at least a portion of the first electrode, over at least a portion of the second electrode, and within the gap. An insulative material encompasses at least a portion of the phase change material bridge.
申请公布号 US7825397(B2) 申请公布日期 2010.11.02
申请号 US20080125970 申请日期 2008.05.23
申请人 SEAGATE TECHNOLOGY LLC 发明人 XI HAIWEN;XUE SONG S.
分类号 H01L45/00 主分类号 H01L45/00
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