发明名称 BLANK MASK AND PHOTO MASK AND METHOD FOR MANUFACTURING THEREOF
摘要 PURPOSE: A blank mask, a photo mask, and a manufacturing method thereof are provided to apply a fine pattern to the blank mask and the photo mask by adding a phase inversion layer. CONSTITUTION: A phase inversion layer, a shielding layer(30), or anti-reflection layer(40) is formed on a transparent substrate(10). The metallic component of a shielding layer is made of materials with Cr. The phase inversion layer, the shielding layer, or the anti-reflection layer is amorphous and is laminated with a reactive sputtering method.
申请公布号 KR20100116343(A) 申请公布日期 2010.11.01
申请号 KR20090034996 申请日期 2009.04.22
申请人 S&STECH CO., LTD. 发明人 NAM, KEE SOO;CHA, HAN SUN;YANG, SIN JU;KIM, JONG MIN
分类号 H01L21/027;G03F1/38 主分类号 H01L21/027
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