发明名称 METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE
摘要 <p>PURPOSE: A manufacturing method of a semiconductor device is provided to uniformly form a gate and to increase the channel length of a transistor. CONSTITUTION: A manufacturing method of a semiconductor device forms a first groove by etching an active region and the formation region of an element isolation layer on a semiconductor substrate(100). The element isolation layer exposed by a first groove is selectively etched. A second groove having the width which is wider than the first groove is formed and is connected to the first groove by etching the upper end part of the exposed active region.</p>
申请公布号 KR20100115890(A) 申请公布日期 2010.10.29
申请号 KR20090034527 申请日期 2009.04.21
申请人 HYNIX SEMICONDUCTOR INC. 发明人 HAN, BYOUNG HEE
分类号 H01L29/78;H01L21/336 主分类号 H01L29/78
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