发明名称 INSPECTION PIN PROTECTION STRUCTURE OF CONDUCTION CHECK APPARATUS
摘要 In order to smoothly advance and retreat a protection board without inclining the protection board, and to surely perform conduction check without an unfavorable bending force or the like to act upon the protection board at the conduction check of a connector, the present invention provides a conduction check apparatus as follow. A conduction check apparatus of the present invention 1 is that includes an inspection part 4 having a main body 22 having a surface 23a, a plurality of inspection pins 21 protruded from the surface 23a, a guide pin 8 provided on the surface 23a; and a protection board 6 sliding along the guide pin 8 from a first position to a. second position and having a plurality of holes 28. At the first position, the protection board 6 covers a tip of each of the inspection pins 21 and, at the second position, each of the inspection pins 21 jut out from the respective one of the holes 28. The conduction check apparatus includes a connector setting part 3 relatively moving toward the inspection part 4. The protection board 6 moves between the first and the second position during the relative movement.
申请公布号 US2010271043(A1) 申请公布日期 2010.10.28
申请号 US20080810534 申请日期 2008.12.26
申请人 YAZAKI CORPORATION 发明人 KATOH HIDEYUKI
分类号 G01R31/04 主分类号 G01R31/04
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