发明名称 TRANSMISSION CHARACTERISTIC MEASUREMENT APPARATUS, TRANSMISSION CHARACTERISTIC MEASUREMENT METHOD, AND ELECTRONIC DEVICE
摘要 <p><P>PROBLEM TO BE SOLVED: To provide a transmission characteristic measurement apparatus for measuring transmission characteristics of a circuit under test. <P>SOLUTION: The transmission characteristic measurement apparatus for measuring transmission characteristics between the input and the output of the circuit to be tested includes: a test signal input part that generates a test signal by adding an additional signal having a frequency different from a predetermined frequency to a carrier signal having the predetermined frequency, and inputs the test signal to the circuit to be tested; and a transmission characteristic measuring part that measures the transmission characteristics of the circuit to be tested at the frequency of the additional signal based on the measurement result of an output signal from the circuit to be tested. The circuit to be tested may be formed in a semiconductor chip. The circuit to be tested may correct a signal input to the semiconductor chip and output the corrected signal. Further, the semiconductor chip may include a sampling circuit for sampling the output signal of the circuit under test at the frequency of the carrier signal. <P>COPYRIGHT: (C)2011,JPO&INPIT</p>
申请公布号 JP2010246108(A) 申请公布日期 2010.10.28
申请号 JP20100075921 申请日期 2010.03.29
申请人 ADVANTEST CORP 发明人 ISHIDA MASAHIRO;HASE KENICHI
分类号 H04L25/02;G01R27/28;H04B3/04;H04B3/46 主分类号 H04L25/02
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