发明名称 |
At-Speed Scan Testing With Controlled Switching Activity |
摘要 |
Test patterns for at-speed scan tests are generated by filling unspecified bits of test cubes with functional background data. Functional background data are scan cell values observed when switching activity of the circuit under test is near a steady state. Hardware implementations in EDT (embedded deterministic test) environment are also disclosed.
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申请公布号 |
US2010275077(A1) |
申请公布日期 |
2010.10.28 |
申请号 |
US20100765530 |
申请日期 |
2010.04.22 |
申请人 |
MENTOR GRAPHICS CORPORATION |
发明人 |
RAJSKI JANUSZ;MOGHADDAM ELHAM K.;MUKHERJEE NILANJAN;KASSAB MARK A.;LIN XIJIANG |
分类号 |
G01R31/3177;G06F11/25 |
主分类号 |
G01R31/3177 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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