发明名称 BONDING STRUCTURE AND SEMICONDUCTOR ELEMENT STORING PACKAGE
摘要 PROBLEM TO BE SOLVED: To provide a bonding structure which achieves highly reliable bonding of a metal member and a ceramic member and in which cracks do not occur in the ceramic member and to provide a highly reliable semiconductor element storing package having the bonding structure. SOLUTION: The bonding structure is provided with: a first member 11 formed of a metal; a second member 12 which is made of ceramics and bonded to the first member 11 and has a metal layer 12a on a surface; a third member 13 formed of a metal arranged over the metal layer 12a of the second member 12 from the first member 11; a brazing material 14 disposed between the first member 11 and the metal layer 12a of the second member 12, and the third member 13; and fillets 15 and 16 formed of the brazing material 14 at a periphery of the third member 13. The third member 13 is provided with a chamfering part 17 serving as an accumulation part of the brazing material 14 only in a part confronting the second member 12 in the bonding structure. The semiconductor element storing package is provided with such a bonded structure. COPYRIGHT: (C)2011,JPO&INPIT
申请公布号 JP2010245141(A) 申请公布日期 2010.10.28
申请号 JP20090089762 申请日期 2009.04.02
申请人 NGK SPARK PLUG CO LTD 发明人 MORI HIROAKI
分类号 H01L23/02;B23K1/00;B23K1/19;B23K101/40;C04B37/02;H01L23/12;H01L23/13 主分类号 H01L23/02
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