发明名称 TESTING DEVICE AND TESTING METHOD
摘要 <p><P>PROBLEM TO BE SOLVED: To provide a testing device which inspects reliability of a light emitting device in a state closer to that in the real usage environment, and surely, rapidly, and easily detect a failure article, and the testing method. <P>SOLUTION: The test device 1 comprises: a first controlling means (a controlling part 40) for controlling a temperature and a humidity of an atmosphere outside an emitting device 70 installed in a constant-temperature constant-humidity bath 10; and a second controlling means (a controlling part 20) for controlling a current value and a time to be passed through the emitting device 70 to make the emitting device 70 exposed to the atmosphere generate heat by applying current intermittently. The temperature and the humidity of the atmosphere outside the emitting device 70 installed in a constant-temperature constant-humidity bath 10 are controlled by using the test device 1, and while the current value and the time to be passed through the emitting device 70 to make the emitting device 70 generate heat by applying current intermittently to implement an accelerated life test of the emitting device 70. <P>COPYRIGHT: (C)2011,JPO&INPIT</p>
申请公布号 JP2010245348(A) 申请公布日期 2010.10.28
申请号 JP20090093353 申请日期 2009.04.07
申请人 HARISON TOSHIBA LIGHTING CORP 发明人 WADA NAOKI;OCHI MUNEHIKO;TERAOKA AYAKO
分类号 H01L33/00;G01R31/26 主分类号 H01L33/00
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