发明名称 DELAYED DESTRUCTIVE TEST METHOD AND TESTER BY INDENTATION METHOD
摘要 PROBLEM TO BE SOLVED: To provide a delayed destructive test method and a delayed destructive tester for eliminating a necessity for applying a fixed tensile stress, and eliminating a necessity for processing a test piece into a predetermined shape to apply the tensile stress. SOLUTION: In the process for forming and growing an indentation and a crack extended from the indentation by applying a load to a plane of the test piece and pressing a tip of an indenter, the destructive test method measures a length of the indentation and a length of the crack several times in a state that the tip of the indenter is pressed into the plane of the test piece, and obtains a crack extension speed da/dt and a stress extension coefficient K<SB>1</SB>by using the obtained lengths of the indentation and the crack. COPYRIGHT: (C)2011,JPO&INPIT
申请公布号 JP2010243387(A) 申请公布日期 2010.10.28
申请号 JP20090093684 申请日期 2009.04.08
申请人 MITSUBISHI ELECTRIC CORP 发明人 YOSHIMOTO TAKAHIRO;SAKAMOTO HIROO;KATAGIRI DAISUKE;ECHIZENYA DAISUKE;SUMIYA HARUHIKO
分类号 G01N3/42 主分类号 G01N3/42
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