| 摘要 |
PROBLEM TO BE SOLVED: To provide an array substrate and an inspection method for efficiently finding a defect in a manufacture stage by addition of minimum inspection circuits and eliminating function decline as a finished product after an inspection is ended. SOLUTION: A defective pixel is detected by configuring: a reference pixel for the inspection for each data line at one end of a plurality of data lines; a data line selector for selecting the data line connected to the pixel of an inspection object from the plurality of data lines; a gate line selector for selecting a gate line connected to the gate of the pixel of the inspection object from a plurality of scanning lines; a comparison signal line for sending an expected value to be the reference of the inspection; a sense amplifier for detecting and amplifying data from the reference pixel and data from the pixel of the inspection object; an EOR comparator for exclusively ORing signals from the comparison signal line and the output of the sense amplifier; an OR output unit for ORing the output of the comparator and the data line selector; and an output line part for connecting the output of all the OR output units and forming wired OR. COPYRIGHT: (C)2011,JPO&INPIT
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