METHODS AND SYSTEM FOR ON-CHIP DECODER FOR ARRAY TEST
摘要
The present invention provides devices capable of testing the electrical performance of thin- film transistor backplane arrays and methods for their use.
申请公布号
WO2010123619(A2)
申请公布日期
2010.10.28
申请号
WO2010US24990
申请日期
2010.02.23
申请人
ARIZONA BOARD OF REGENTS, A BODY CORPORATE ACTINGFOR AND ON BEHALF OF ARIZONA STATE UNIVERSITY;BAWOLEK, EDWARD, J.;MOYER, CURTIS, D.;VENUGOPAL, SAMEER, M.
发明人
BAWOLEK, EDWARD, J.;MOYER, CURTIS, D.;VENUGOPAL, SAMEER, M.
