发明名称 Apparatus for plasma-enhanced physical vapor deposition of copper with RF source power applied through the workpiece with a lighter-than-copper carrier gas
摘要 A method of performing physical vapor deposition of copper onto an integrated circuit in a vacuum chamber of a plasma reactor includes providing a copper target near a ceiling of the chamber, placing an integrated circuit wafer on a wafer support pedestal facing the target near a floor of the chamber, introducing a carrier gas into the vacuum chamber having an atomic weight substantially less than the atomic weight of copper, maintaining a target-sputtering plasma at the target to produce a stream comprising at least one of copper atoms and copper ions flowing from the target toward the wafer support pedestal for vapor deposition, maintaining a wafer-sputtering plasma near the wafer support pedestal by capacitively coupling plasma RF source power to the wafer-sputtering plasma, and accelerating copper ions of the wafer sputtering plasma in a direction normal to a surface of the wafer support pedestal.
申请公布号 US7820020(B2) 申请公布日期 2010.10.26
申请号 US20050140513 申请日期 2005.05.25
申请人 APPLIED MATERIALS, INC. 发明人 BROWN KARL M.;PIPITONE JOHN;MEHTA VINEET;HOFMANN RALF
分类号 C23C14/00 主分类号 C23C14/00
代理机构 代理人
主权项
地址