发明名称 Inductance analysis system and method and program therefor
摘要 System, method and program for inductance analysis for reducing time for analysis, to cope with increase in the system size, to achieve high accuracy in the analysis. Information on a power supply plane, in a state in which a beginning point of non-coupled current of return current accompanying a signal current is placed in the vicinity of a signal through-hole on the power supply plane, based on position information of said signal through-hole, is received. Potential distribution in the power supply plane is determined and output. The non-coupled inductance from the signal through-hole to the power supply through-hole in the power supply plane is evaluated. In the potential analysis, non-coupled inductance L from the signal through-hole to the power supply through-hole is represented by resistance R. The relationship that a voltage increment &Dgr;V is represented by the product of the non-coupled inductance L and the rate of time change of the current, &Dgr;V=L&Dgr;I/&Dgr;t, is replaced by the relationship that the voltage V is represented by the product of resistance R and non-coupled current I, V=R×I. Potential analysis is performed by analyzing two-dimensional heat diffusion in the power supply plane assuming that a heat source is placed at a beginning point of the non-coupled current.
申请公布号 US7823096(B2) 申请公布日期 2010.10.26
申请号 US20060495711 申请日期 2006.07.31
申请人 ELPIDA MEMORY, INC. 发明人 KATAGIRI MITSUAKI;IIDA TAKASHI;SHIMIZU HIROYA;ISA SATOSHI
分类号 G06F17/50;H01L23/52 主分类号 G06F17/50
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